A Hierarchical Modeling and Fault Diagnosis Method for Complex Electronic Devices

⎯Due to the shortcomings of the diagnosis systems for complex electronic devices such as failure models hard to build and low fault isolation resolution, a new hierarchical modeling and diagnosis method is proposed based on multisignal model and support vector machine (SVM). Multisignal model is used to describe the failure propagation relationship in electronic device system, and the most probable failure printed circuit boards (PCBs) can be found by Bayes inference. The exact failure modes in the PCBs can be identified by SVM. The results show the proposed modeling and diagnosis method is effective and suitable for diagnosis for complex electronic devices. Index Terms⎯Bayes inference, complex electronic devices, fault diagnosis, hierarchical modeling, support vector machine.